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Program Overview

The program begins with a Tutorial, on Sunday afternoon, March 1. Following the Tutorial is a fully-catered welcome reception, beginning at 7 pm in the Antlers Room at The Village. Regular morning sessions, consisting of contributed and invited oral presentations, begin Monday morning and extend through Thursday. After-dinner presentations will be held on Monday, Tuesday and Wednesday evenings, followed by poster sessions each night. Complete buffet breakfasts will be served Monday through Thursday, and full buffet dinners will be served Monday through Wednesday. As per PXRMS tradition, weekday afternoons are free.

Topics To Be Considered

Growth

• multilayer deposition techniques
• growth dynamics
• growth models and computer simulations
• development of microstructure and morphology
• interfacial phase formation

Characterization

• X-ray diffraction
• neutron diffraction
• electron microscopy
• surface microscopy
• ellipsometry
• chemical analysis
• novel techniques

Structure and Properties

• X-ray and EUV reflectance, transmittance, and polarization
• soft x-ray optical constants
• X-ray optics applications
• electronic, magnetic, and mechanical properties
• thermal stability
• stability to radiation

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Invited Speakers

E. Alp, Advanced Photon Source, USA

S. Bader, Argonne National Laboratory, USA

L. Golub, Harvard-Smithsonian Center for Astrophysics, USA

V. Holy, Masaryk University, Czech Republic

W. Jark, Sincrotrone Trieste, Italy

D. Joyeux, Institut d'Optique, France

H. Kumagai / M. Ishii, RIKEN, Japan

N. V. Smith, Lawrence Berkeley Laboratory, USA

J. Stohr, IBM Almaden Research Center, USA

H. Zabel, Ruhr-Universitat Bochum, Germany

Tutorial on X-Ray Scattering From Multilayers and Thin Films

By popular demand, the Tutorial on X-Ray Scattering From Multilayers and Thin Films will be held on Sunday afternoon (specific time to be determined,) March 1. Thank you to everyone who took the time to send us your comments on it. The tutorial is intended to be a very practical and useful session for people who want to use these techniques. Therefore it will include theory, practical examples and useful advice for those new to the field, as well as enough detail and discussion to make it worthwhile for experienced scientists.

Cost: No charge to conference attendees!

Tutorial Program

Part I. X-Ray Diffraction and X-Ray Reflectivity Analysis

Eric Fullerton

Part II. Diffuse Scattering: X-Ray and EUV

Eberhard Spiller

Part III. Commercial Software for XRR and Diffuse Scattering Analysis

Keith Bowen, Bede Scientific

Dick de Boer, Philips Research Laboratories

Bede and Philips are planning to have their sofware available for hands-on demonstrations throughout the remainder of the conference. It also may be possible to accomodate a limited number of other software demonstrations during the meeting. Anyone interested should contact the organizers without delay.