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About Reflective X-ray Optics
Reflective X-ray Optics LLC (RXO) was
formed in 2005 by Dr. David L. Windt, company president. Since its founding,
RXO has produced EUV multilayer coatings for NASA’s SDO/AIA and GOES-16/SUVI
solar physics satellite instruments, and hard X-ray multilayer coatings for
NASA’s NuSTAR astronomy mission. RXO has also produced coatings
for a number of NASA sounding-rocket instruments, including Hi-C,
MOSES, EUNIS, VERIS and SCORE, along with a variety of novel coatings for other EUV
and X-ray applications as well.
David L. Windt received a B.S. degree in physics
from the University of Connecticut, and M.S. and Ph.D. degrees in physics from
the University of Colorado, Boulder. He holds an Adjunct Research Scientist
position in the Columbia Astrophysics Laboratory at Columbia University, and
has held past research positions at Columbia University, Bell Laboratories, and
the Lockheed Palo Alto Research Laboratory. His research over the past three+
decades has focused largely on the development of X-ray optics for a variety of
scientific, technological, and medical applications, including astronomy, solar
physics, EUV lithography, and X-ray mammography. CV, Publications,
GPG Public Key
Performance
optimization of Si/Gd extreme ultraviolet multilayers
D. L. Windt, J. A. Bellotti, B. Kjornrattanawanich,
and J. F. Seely, App. Opt. 48,
5502 – 5508 (2009)
Performance,
structure and stability of SiC/Al multilayer films for extreme ultraviolet
applications
D. L. Windt and J. A. Bellotti, App. Opt. 48, 4932 – 4941 (2009)
Normal-incidence
silicon–gadolinium multilayers for imaging at 63 nm wavelength
B.
Kjornrattanawanich, D. L. Windt and J. F.
Seely, Opt. Lett., 33, 465
(2008)
The EUV Imaging Spectrometer for Hinode
J.
L. Culhane, L. K. Harra, A. M. James, J. Al-Janabi,
L. J. Bradley, R. A. Chaudry, K. Rees, J. A. Tandy, P. Thomas, M. C. R.
Whillock, B. Winter, G. Doschek, C. M. Korendyke, C. M., Brown, S. Myers, J. Mariska,J.
Seely, J. Lang, B. J. Kent, B. M., Shaughnessy, P. R. Young, G. M. Simnett, C. M., Castelli, S. Mahmoud, H. Mapson-Menard, B.
J. Probyn, R. J. Thomas, J. Davila, K. Dere, D. Windt, J. Shea, R. Hagood, R.
Moye, H. Hara, T. Watanabe, K. Matsuzaki, T. Kosugi, V. Hansteen, Ř. Wikstol,
Solar
Physics, 243, 19 – 61 (2007)
Terbium-based extreme ultraviolet
multilayers
D. L. Windt, J. F. Seely, B. Kjornrattanawanich, and
Yu. A. Uspenskii, Opt. Lett., 30, 3186 - 3188 (2005)
Stability of EUV multilayers to long-term heating, and to energetic protons and
neutrons, for extreme solar missions
A. D. Rousseau, D. L. Windt, B. Winter, L. Harra, H. Lamoureux, and F.
Eriksson, Proc. SPIE, 5900
(2005)
Development and testing of EUV
multilayer coatings for the Atmospheric Imaging Assembly aboard the Solar
Dynamics Observatory
R. Soufli, D. L. Windt, J. C. Robinson, S. L. Baker,
E. Spiller, F. J. Dollar, A. L. Aquila, E. M. Gullikson, B. Kjornrattanawanich,
J. F. Seely, L. Golub, Proc. SPIE,
5901 (2005)
Experimental comparison of
extreme-ultraviolet multilayers for solar physics
D. L. Windt, S.
Donguy, J. Seely and B. Kjornrattanawanich, App. Opt. 43, 1835 – 1848 (2004)
Normal-incidence efficiencies of
multilayer-coated laminar gratings for the Extreme-Ultraviolet Imaging
Spectrometer on the Solar-B mission
J. F. Seely, C.
M. Brown, D. L. Windt, S. Donguy and B. Kjornrattanawanich,
App. Opt., 43, 1463 - 1471
(2004)
EUV multilayers for solar physics
D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich,
E. M. Gullikson, C. C. Walton, L. Golub, E. DeLuca, Proc. SPIE, 5168, 1 (2003)
Optical constants for hard x-ray
multilayers over the energy range E=35 - 180 keV
D. L. Windt, S. Donguy, C. J. Hailey, J. Koglin, V. Honkimaki,
E. Ziegler, F. E. Christensen, F. A. Harrison, Proc. SPIE, 5168, 35 (2003)
W/SiC X-ray multilayers optimized for use
above 100 keV
D. L. Windt, S. Donguy, C. J. Hailey, J. Koglin, V. Honkimaki,
E. Ziegler, F. E. Christensen, C. M. H. Chen, F. A. Harrison, W. W. Craig, Proc. SPIE, 4851, 639 (2002) & App. Opt., 42, 2415 - 2421 (2003)
Microstructure of thin tantalum films
sputtered onto inclined substrates: Experiments and atomistic simulations
J. Dalla Torre, G. H. Gilmer, D. L. Windt, R. Kalyanaraman, F. H. Baumann, P.
L. O'Sullivan, J. Sapjeta, T. Diaz de la Rubia, and
M. Djafari Rouhani, J. App. Phys., 94, 263 - 271 (2003)
Diffraction-limited astronomical X-ray
imaging and X-ray interferometry using normal-incidence multilayer optics
D. L. Windt, S. M. Kahn, G. E. Sommargren, Proc. SPIE, 4851, 441 (2003)
Normal-incidence reflectance of optimized
W/B4C X-ray multilayers in the range 1.4 nm < lambda < 2.4 nm
D. L. Windt, E. M. Gullikson, C. C. Walton, Opt. Lett., 27, 2212-2214 (2002)
The feasibility of detecting 'cosmological'
gray dust
D. L. Windt, Ap. J. L., 564,
L61 (2002)
A photometric imaging solar telescope,
tunable in the extreme ultraviolet, utilizing multilayer X-ray optics
L. Golub, E. DeLuca, P. Hamilton, G. Nystrom, D. L. Windt, W. K. H. Schmidt and
A. Dannenberg, Rev. Sci. Instr.,
73, 1908 (2002)
Growth, structure and performance of
depth-graded W/Si multilayers for hard X-ray optics
D. L. Windt , F. E. Christensen, W. W. Craig, C. Hailey, F. A. Harrison, M.
Jimenez-Garate, R. Kalyanaraman, and P. H. Mao, J. Appl. Phys., 88, 460 (2000)
X-ray multilayer coatings for use at
energies above 100 keV
D. L. Windt , F. E. Christensen, W. W. Craig, C. Hailey, F. A. Harrison, M.
Jimenez-Garate, R. Kalyanaraman, and P. H. Mao, Proc. SPIE, 4012, 442
(2000)
Stress, microstructure and stability of
Mo/Si, W/Si, and Mo/C multilayer films
D. L. Windt , J. Vac. Sci. Technol. A,
18, 980-991 (2000)
The scattering of X-rays by interstellar
dust on the micro-arcsecond scale
D. L. Windt, W. C. Cash and S. M. Kahn
Ap. J., 528, 306-309 (2000)
Growth and structure of metallic barrier
layer and interconnect films I: experiments
D. L. Windt, J. Dalla Torre, G. H. Gilmer, J. Sapjeta,
R. Kalyanaraman, F. H. Baumann, P. L. O'Sullivan, D. Dunn, R. Hull Proc. MRS, 564, 307-312 (1999)
Growth and structure of metallic barrier
layer and interconnect films II: atomistic simulations of film deposition onto
inclined surfaces
J. Dalla Torre, G. H. Gilmer, D. L. Windt, F. H. Baumann, R. Kalyanaraman, Hanchen Huang, T. Diaz de la Rubia, and M. Djafari Rouhani
Proc. MRS, 564, (1999)
Low-stress W/Cr films for SCALPEL mask
scattering layers
D. L. Windt, J. Vac. Sci. Technol. B,
17, 1385-1389 (1999)
Amorphous carbon films for use as both
variable-transmission apertures and attenuated phase-shift masks for DUV
lithography
D. L. Windt and R. A. Cirelli, J. Vac.
Sci. Technol. B, 17, 930-932 (1999)
Multilayer films for figured X-ray optics
D. L. Windt, Proc. SPIE 3448
(1998)
IMD: Software for modeling the optical
properties of multilayer films
D. L. Windt, Computers in Physics, 12,
360-370 (1998)
Variation in stress with background pressure
in sputtered Mo/Si multilayer films
D. L. Windt, W. L. Brown, C. A. Volkert, and W. K. Waskiewicz, J. Appl. Phys., 78 2423-2430 (1995)
Multilayer facilities required for
extreme-ultraviolet lithography
D. L. Windt and W. K. Waskiewicz, J.
Vac. Sci. Technol. B, 12, 3826-3832 (1994)
Surface finish requirements for soft x-ray
mirrors
D. L. Windt, W. K. Waskiewicz, and J. E. Griffith, App. Op., 33, 2025-2031 (1994)