X-ray multilayer structures are now finding wide use in both commercial and academic applications, and have contributed to our fundamental understanding of a variety of physical phenomena. Research in materials science and X-ray optical physics is now directed at improving the performance and expanding the applicability of these structures.

This conference is intended to provide an informal setting for participants to present recent results and exchange new ideas on such topics as growth, interface formation, microstructure development, and characterization techniques of thin films and multilayers in general, and on optical properties and new applications of X-ray multilayer structures in particular.